Image analysis – Pattern recognition – Classification
Reexamination Certificate
2007-02-28
2010-10-12
Couso, Yon (Department: 2624)
Image analysis
Pattern recognition
Classification
C382S305000
Reexamination Certificate
active
07813560
ABSTRACT:
A method for automatically classifying images into a final set of events including receiving a first plurality of images having date-time and a second plurality of images with incomplete date-time information; determining one or more time differences of the first plurality of images based on date-time clustering of the images and classify the first plurality of images into a first set of possible events; analyzing the second plurality of images using scene content and metadata cues and selecting images which correspond to different events in the first set of possible events and combining them into their corresponding possible events to thereby produce a second set of possible events; and using image scene content to verify the second set of possible events and to change the classification of images which correspond to different possible events to thereby provide the final set of events.
REFERENCES:
patent: 6351556 (2002-02-01), Loui et al.
patent: 6606411 (2003-08-01), Loui et al.
patent: 6636648 (2003-10-01), Loui et al.
patent: 6898737 (2005-05-01), Goeller et al.
patent: 6996782 (2006-02-01), Parker et al.
patent: 2007/0236729 (2007-10-01), Yoda
patent: 2008/0062282 (2008-03-01), Shiimori
patent: 2008/0183049 (2008-07-01), Karkanias et al.
Kraus Bryan D.
Loui Alexander C.
Couso Yon
Eastman Kodak Company
Owens Raymond L.
LandOfFree
Classifying complete and incomplete date-time information does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Classifying complete and incomplete date-time information, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Classifying complete and incomplete date-time information will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4221105