Classifying an analog voltage in a control system using...

Data processing: artificial intelligence – Machine learning

Reexamination Certificate

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C706S045000, C706S047000

Reexamination Certificate

active

11005128

ABSTRACT:
In one embodiment, the present invention includes a method of successively splitting an analog function into high and low ranges and calculating a binary mask for these ranges to obtain a plurality of data regions at a plurality of split levels, and training binary classifiers on the plurality of data regions of at least one of the split levels. In such manner, binary classifiers may be used to classify an analog function. Other embodiments are described and claimed.

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