Classification via semi-riemannian spaces

Data processing: artificial intelligence – Machine learning

Reexamination Certificate

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Reexamination Certificate

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07996343

ABSTRACT:
Described is using semi-Riemannian geometry in supervised learning to learn a discriminant subspace for classification, e.g., labeled samples are used to learn the geometry of a semi-Riemannian submanifold. For a given sample, the K nearest classes of that sample are determined, along with the nearest samples that are in other classes, and the nearest samples in that sample's same class. The distances between these samples are computed, and used in computing a metric matrix. The metric matrix is used to compute a projection matrix that corresponds to the discriminant subspace. In online classification, as a new sample is received, it is projected into a feature space by use of the projection matrix and classified accordingly.

REFERENCES:
patent: 7010167 (2006-03-01), Ordowski et al.
patent: 7016884 (2006-03-01), Platt et al.
patent: 7203346 (2007-04-01), Kim et al.
patent: 2004/0017947 (2004-01-01), Yang
patent: 2005/0163384 (2005-07-01), Avni et al.
patent: 2007/0160296 (2007-07-01), Lee et al.
patent: 2008/0014563 (2008-01-01), Visani et al.
patent: 2008/0016016 (2008-01-01), Mitarai et al.
patent: 2009/0297046 (2009-12-01), Zhao et al.
patent: 2010/0067800 (2010-03-01), Lin et al.
patent: 2010/0076723 (2010-03-01), Zhang et al.
patent: 2010/0121792 (2010-05-01), Yang et al.
patent: 2005101298 (2005-10-01), None
Zhao et al., Classifiaction via Semi-Riemannian Spaces, 2008, IEEE, pp. 1-8.
Lu, et al., “Face Recognition Using LDA-Based Algorithms”, IEEE Transactions on Neural Networks, vol. 14, No. 1, Jan. 2003, pp. 195-200.
Seong-Wook Joo, “Face Recognition using PCA and FDA with intensity normalization”, Dec. 2003, 6 pages.
B. K Julsing, “Face Recognition with Local Binary Patterns”, Bachelor Assignment, May 11, 2007, 57 pages.
Yu, et al., “A Direct LDA Algorithm for High Dimensional Data -with Application to Face Recognition”, Sep. 29, 2000, pp. 1-3.
Tenenbaum, et al., “A Global Geometric Framework for Nonlinear Dimensionality Reduction”, Apr. 4, 2007, 18 pages.
Jieping Ye, “A Two-Stage Linear Discriminant Analysis via QR-Decomposition”, IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 27, No. 6, Jun. 2005, pp. 929-941.
Wang, et al., “A Unified Framework for Subspace Face Recognition”, IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 26, No. 9, Sep. 2004, pp. 1222-1228.
Finbarr O' Sullivan, “Discretized Laplacian Smoothing by Fourier Iviethods”, Technical Report No. 162, Jun. 1989, 25 pages.
Wang, et al., “Dual-Space Linear Discriminant Analysis for Face Recognition”, Proceedings of the 2004 IEEE Computer Society Conference on Computer Vision and Pattern Recognition (CVPR'04), 2004, 6 pages.
Li, et al., “Efficient and Robust Feature Extraction by Maximum Margin Criterion”, Jan. 2006, pp. 1-18.
Belhumeur, et al., “Eigenfaces vs. Fisherfaces: Recognition Using Class Specific Linear Projection”, IEEE Transactions Pattern Analysis and Machine Intelligence, vol. 19, Issue 7, Jul. 1997, pp. 711-720.
Ahonen, et al., “Face Description with Local Binary Patterns: Application to Face Recognition”, IEEE Transactions on Pattern Analysis and Machine Intelligence, Jun. 5, 2006, pp. 1-15.
Qiu, et al., “Face Recognition by Stepwise Nonparametric Margin Maximum Criterion”, Tenth IEEE International Conference on Computer Vision (ICCV'05) vol. 2, 2005, pp. 1567-1572.
He, et al., “Face Recognition Using Laplacianfaces”, 2005, pp. 1-34.
Wang, et al., “Feature Extraction by Maximizing the Average Neighborhood Margin”, Computer Vision and Pattern Recognition, CVPR '07, IEEE Conference (2007), pp. 1-8.
Howland, et al., “Generalizing Discriminant Analysis Using the Generalized Singular Value Decomposition”, Apr. 7, 2003, pp. 1-23.
Yan, et al., “Graph Embedding: A General Framework for Dimensionality Reduction”, IEEE Computer Society Conference on Computer Vision and Pattern Recognition, CVPR 2005, vol. 2, pp. 830-837.
Yang, et al., “KPCA Plus LDA: A Complete Kernel Fisher Discriminant Framework for Feature Extraction and Recognition”, IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 27, No. 2, Feb. 2005, pp. 230-244.
Zhao, et al., “Laplacian PCA and Its Applications”, ICCV'07, 2007, 8 pages.
Cai, et al., “Learning a Spatially Smooth Subspace for Face Recognition”, IEEE Conference on Computer Vision and Pattern Recognition, CVPR '07, 2007, 7 pages.
Zhao, et al., “Linear Laplacian Discrimination for Feature Extraction”, IEEE Conference on Computer Vision and Pattern Recognition, CVPR '07, 2007, pp. 1-7.
Wang, et al., “Local and Weighted Maximum Margin Discriminant Analysis”, IEEE Conference on Computer Vision and Pattern Recognition, CVPR '07, Jun. 2007, pp. 1-8.
Roweis, et al., “Nonlinear Dimensionality Reduction by Locally Linear Embedding”, Science Reports, vol. 290, Dec. 22, 2000, pp. 2323-2326.
Phillips, et al., “Overview of the Face Recognition Grand Challenge”, IEEE Computer Society Conference on Computer Vision and Pattern Recognition, CVPR 2005, vol. 1, Jun. 2005, pp. 947-954.
Hastie, et al., “Penalized Discriminant Analysis”, May 25, 1994, pp. 1-31.
Wang, et al., “Random Sampling for Subspace Face Recognition”, International Journal of Computer Vision 70(1), 2006, pp. 91-104.
“Regularized Discriminant Analysis”, Elements of Statistical Learning, Tibshirani and Friedman, 2001, Chapter 4, pp. 1-24.
Cai, et al., “Spectral Regression for Efficient Regularized Subspace Learning”, IEEE 11th International Conference on Computer Vision, ICCV 2007, Oct. 2007, pp. 1-8.
Hastie, et al., “The Elements of Statistical Learning”, Data Mining, Inference, and Prediction, Springer, 2001, 9 pages.
Fisher, et al., “The Statistical Utilization of Multiple Measurements”, Annals of Eugenics, 8, 1938, pp. 130-143.
Wang, et al., “Trace Ratio vs. Ratio Trace for Dimensionality Reduction”, IEEE Int. Conf. on Computer Vision and Pattern Recognition, 2007, 8 pages.
Martinez, et al., “Where Are Linear Feature Extraction Methods Applicable”, IEEE Transaction on Pattern Analysis and Machine Intelligence, vol. 27, No. 12, 2005, pp. 1-20.

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