Image analysis – Pattern recognition – Classification
Patent
1995-12-20
1998-07-07
Shalwala, Bipin
Image analysis
Pattern recognition
Classification
382190, 382226, 382227, 382245, G06K 962, G06K 968, G06K 970, G06K 946
Patent
active
057780951
ABSTRACT:
A method and apparatus for classification of scanned symbol into equivalence classes as may be used for image data compression. The present invention performs run-length symbol extraction and classifies symbols based on both horizontal and vertical run length information. An equivalence class is represented by an exemplar. Feature-based classification criteria for matching an exemplar is defined by a corresponding exemplar template. The feature-based classification criteria all use quantities that can be readily computed from the run endpoints. Reducing the number of equivalence classes is achieved through a process called equivalence class consolidation. Equivalence class consolidation utilizes the symbol classifier to identify matched exemplars indicating equivalence classes which may be merged. For a consolidated equivalence class, the exemplar matching the most symbols is selected as the representative for the class.
REFERENCES:
patent: 4499596 (1985-02-01), Casey et al.
patent: 4799270 (1989-01-01), Kim et al.
patent: 4864628 (1989-09-01), Scott
patent: 4977603 (1990-12-01), Irie et al.
patent: 5075896 (1991-12-01), Wilcox et al.
patent: 5263097 (1993-11-01), Katz et al.
patent: 5303313 (1994-04-01), Mark et al.
patent: 5317649 (1994-05-01), Nishida
patent: 5359671 (1994-10-01), Rao
patent: 5390259 (1995-02-01), Withgott et al.
patent: 5479523 (1995-12-01), Gaborski et al.
Huttenlocher, D.P., Klanderman, G.A., and Rucklidge, W.J., "Comparing Images Using the Hausdorf Distance," Research Report for Department of Computer Science, Cornell University, Ithaca, N.Y., 1991.
Huttenlocher, D.P., Rucklidge, W.J., "A Multi-Resolution Technique for Comparing Images Using the Hausdorff Distance," Research Report for Department of Computer Science, Cornell University, Ithaca, N.Y., 1992.
Domingo Richard B.
Shalwala Bipin
Xerox Corporation
LandOfFree
Classification of scanned symbols into equivalence classes does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Classification of scanned symbols into equivalence classes, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Classification of scanned symbols into equivalence classes will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1215294