Clamping test fixture for a high frequency miniature probe...

Details Clamping test fixture for a high frequency miniature probe... Clamping test fixture for a high frequency miniature probe...

2006-10-03

2006-10-03

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S757020, C324S1540PB

Reexamination Certificate

active

07116120

ABSTRACT:
An oscilloscope probe test fixture provides separate clamps for pressing each probe tip against a location along a transmission line. Multiple adjacent clamps may share a common axle. One clamp is positioned over a ground plane that adjoins the center conductor of a strip transmission line, while another is positioned over that center conductor. Each individual clamp has a respective compression spring on one side of the axle to produce clamping on the other, and the lengths from the axle to the springs act as a respective thumb lever that allows each clamp to be opened to receive a probe tip. The length from the axle to the spring is significantly longer than that from the axle to the actual clamping surface (foot) to provide increased clamping force. The foot of each clamp is mostly under the axle, while their thumb lever portions extend parallel to a substrate that carries the strip transmission line, allowing the location of the clamping to be close to the driven end of the test fixture. The transmission line may be internally terminated or terminated externally through an RF connector.

REFERENCES:
patent: 4225819 (1980-09-01), Grau et al.
patent: 5614820 (1997-03-01), Aoyama et al.
patent: 6515498 (2003-02-01), Kobayashi et al.

Affiliated with

Also associated with

Rating

Clamping test fixture for a high frequency miniature probe... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Clamping test fixture for a high frequency miniature probe..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Clamping test fixture for a high frequency miniature probe... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3641718