Clamp for testing used integrated circuit devices

Details Clamp for testing used integrated circuit devices Clamp for testing used integrated circuit devices

1992-08-04

1993-09-14

Nguyen, Vinh

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324158P, G01R 3102

Patent

active

052452778

ABSTRACT:
A clamp for a test socket for testing packaged integrated circuit devices, particularly used devices, includes grooves corresponding to original pin locations of the integrated circuit device. When an integrated circuit device having misaligned pins is placed in the test socket and the clamp is set upon the integrated circuit device and manually shifted against the integrated circuit device, grooves receive the pins, aligning any misaligned pins properly against contacts in the socket. Closing the socket causes the pins to be firmly aligned against the contacts for testing.

REFERENCES:
patent: 4766371 (1988-08-01), Moriya
patent: 4940935 (1990-07-01), Riley
patent: 4962356 (1990-10-01), Eberlein et al.
patent: 4980635 (1990-12-01), Walton et al.

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