Circumferentially compensating eddy current probe with alternate

Details Circumferentially compensating eddy current probe with alternate Circumferentially compensating eddy current probe with alternate

1987-02-19

1989-02-28

Strecker, Gerard R.

Electricity: measuring and testing

Magnetic

Magnetic sensor within material

324225, 324232, 324242, G01N 2790, G01R 3312

Patent

active

048089249

ABSTRACT:
An eddy current probe capable of detecting defects independent of orientation, with complete circumferential coverage in tubes, tubes under support plates, etc., is disclosed. The probe employs multiple coils, operating in transmit-receive mode, in which alternate coils are electromagnetically polarized in opposite directions. The probe detects localized defects and eliminates concentric variations.

REFERENCES:
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patent: 3166710 (1965-01-01), Schmidt
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patent: 3241058 (1966-05-01), Quittner
patent: 3271662 (1966-09-01), Quittner
patent: 3444459 (1969-05-01), Prindle et al.
patent: 3952315 (1976-04-01), Cecco
patent: 4079312 (1978-03-01), Osborn et al.
patent: 4083002 (1978-04-01), Allport
patent: 4608534 (1986-08-01), Cecco et al.

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