Circuits, systems and methods for testing ASIC and RAM memory de

Details Circuits, systems and methods for testing ASIC and RAM memory de Circuits, systems and methods for testing ASIC and RAM memory de

1995-02-13

1997-01-07

Wieder, Kenneth A.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

371 224, 257202, G01R 100, H04B 1700

Patent

active

055920772

ABSTRACT:
Systems and methods for testing ASIC and RAM memory devices are disclosed. The method comprises determining a signature map of valid power supply current values for a known good microcircuit wherein each valid power supply current value is measured at a fixed level of power supply voltage and corresponds to a unique test input stimuli pattern applied to the known good microcircuit. The signature map of power supply current values is stored in an electronic memory (300). The test input stimuli patterns are then applied to an unproven microcircuit (330) and the power supply current of the unproven microcircuit is forced to the levels stored in the signature map by a current supply (360) while the voltages across the power supply inputs of the unproven microcircuit are measured by a voltmeter (340). The measured power supply voltages for each power supply current value are then compared to the fixed voltage supply level used to test the known good microcircuit. The unproven microcircuit is faulted if any measured power supply voltage of the unproven microcircuit differs substantially from the fixed power supply voltage applied to the known good microcircuit.

REFERENCES:
patent: 5047711 (1991-09-01), Smith et al.
patent: 5138610 (1992-08-01), Fasang et al.
patent: 5230000 (1993-07-01), Mozingo et al.

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