Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-06-26
2007-06-26
Wachsman, Hal (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S064000, C702S080000, C702S107000, C365S189090
Reexamination Certificate
active
11021598
ABSTRACT:
A circuit, system and method adjusts a reference voltage, such as an internal or external reference voltage VREF, in response to a first voltage at a first contact, such as a pin on a memory controller used for reading or writing data, and a second voltage at a second contact in embodiments. Logic is coupled to the first and second contacts to provide a control signal in response to the first and second voltages. A comparator provides an input signal to the logic in response to a target reference voltage and the reference voltage during a calibration or initialization mode of operation. In an alternate embodiment, a plurality of data values at a first contact are compared to a predetermined plurality of test data. An up/down signal is then provided to a counter and a register stores a counter value used to provide a reference voltage.
REFERENCES:
patent: 4604732 (1986-08-01), van Tran
patent: 5426616 (1995-06-01), Kajigaya et al.
patent: 5999021 (1999-12-01), Jang
patent: 6040735 (2000-03-01), Park et al.
patent: 6118265 (2000-09-01), Larsen et al.
patent: 6154065 (2000-11-01), Komatsu
patent: 6229383 (2001-05-01), Ooishi
patent: 6239652 (2001-05-01), Oh et al.
patent: 6288954 (2001-09-01), Manning
patent: 6546343 (2003-04-01), Batra et al.
patent: 6643787 (2003-11-01), Zerbe et al.
patent: 6646911 (2003-11-01), Hidaka
patent: 6684263 (2004-01-01), Horowitz et al.
patent: 6707724 (2004-03-01), Kim et al.
patent: 6826103 (2004-11-01), Moon et al.
patent: 6876585 (2005-04-01), Choi et al.
patent: 6882593 (2005-04-01), Best et al.
patent: 6885959 (2005-04-01), Salmon et al.
patent: 6940777 (2005-09-01), Ooishi
patent: 2001/0014049 (2001-08-01), Woo et al.
patent: 2003/0151450 (2003-08-01), Nguyen et al.
Lambrecht Frank
Nguyen David
Oh Kyung Suk
Rambus Inc.
Vierra Magen Marcus & DeNiro LLP
Wachsman Hal
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