Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-01-09
2007-01-09
Wachsman, Hal (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S064000, C702S080000, C702S107000, C365S189090
Reexamination Certificate
active
11063490
ABSTRACT:
A system comprises a master device and a plurality of memory devices coupled to the master device by an interconnect in an embodiment. The master device obtains a plurality of values representing reference voltage values and selects a first value in the plurality of values representing reference voltage values to generate an internal reference voltage value when reading data from a selected memory device in the plurality of memory devices. A method comprises obtaining a plurality of values representing reference voltages for a plurality of memory devices in an embodiment. A first value is selected in the plurality of values representing reference voltages. A reference voltage value is adjusted in response to the first value to an adjusted reference voltage value. Data is transferred to a selected memory device in the plurality of memory devices using the adjusted reference voltage value.
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Lambrecht Frank
Nguyen David
Oh Kyung Suk
Rambus Inc.
Vierra Magen Marcus & DeNiro LLP
Wachsman Hal
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