Static information storage and retrieval – Powering – Data preservation
Reexamination Certificate
2009-03-11
2010-12-14
Mai, Son L (Department: 2827)
Static information storage and retrieval
Powering
Data preservation
C365S201000, C365S226000, C714S718000, C714S719000
Reexamination Certificate
active
07852701
ABSTRACT:
A circuit structure for determining a period of time during which a device was without power is disclosed. The circuit structure comprises a volatile memory storing known data and a test circuit coupled to the volatile memory, the test circuit determining an amount of incorrect data stored in the volatile memory after a period of time during which the device was without power. The amount of incorrect data is used to determine the period of time during which the device was without power. A method of controlling a device based on the amount of incorrect data stored in a volatile memory after the device was without power is also disclosed. For example, the device can be controlled by altering a start-up sequence of one or more elements of the device.
REFERENCES:
patent: 4422163 (1983-12-01), Oldenkamp
patent: 5023874 (1991-06-01), Houston
patent: 5422852 (1995-06-01), Houston et al.
patent: 6101421 (2000-08-01), Goedken et al.
patent: 7111224 (2006-09-01), Trimberger
patent: 7353374 (2008-04-01), Trimberger
patent: 7436726 (2008-10-01), Lovejoy
Lesea, Austin, “IP Security in FPGAs,”WP261(v.1.0), Feb. 16, 2007, pp. 1-9, available from Xilinx, Inc., 2100 Logic Drive, San Jose, California 95124, USA.
Skorobogatov, Sergei, “Low temperature data remanence in static RAM,”Univ. of Cambridge Technical Report No. 536, Jun. 2002, pp. 1-9, available from University of Cambridge, 15 JJ Thomson Avenue, Cambridge CB3 0FD, United Kingdom.
Tuan, Tim, “Analysis of Data Remanence in a 90 nm FPGA,”Proc. of the 2007 Custom Integrated Circuits Conference, Sep. 16-19, 2007, pp. 93-96, San Jose, California, USA.
King John J.
Mai Son L
Xilinx , Inc.
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