Circuits, architectures, apparatuses, systems, and methods...

Details Circuits, architectures, apparatuses, systems, and methods... Circuits, architectures, apparatuses, systems, and methods...

2007-10-09

2010-11-23

DeBeradinis, Robert (Department: 2836)

Electricity: electrical systems and devices

Safety and protection of systems and devices

Load shunting by fault responsive means

Reexamination Certificate

active

07839612

ABSTRACT:
Circuits, systems, and methods for protecting an integrated circuit device having a first power rail and a second power rail from electrostatic discharge (ESD) events. The ESD protection circuit generally comprises an ESD shunt device coupled to the first power rail and a ground potential, a bias circuit configured to provide a bias voltage to the ESD shunt device during a normal mode of operation and to disable the bias voltage during an ESD event on the first power rail, and an isolation circuit configured to isolate the second power rail from the ESD shunt device during the normal mode of operation and to couple the second power rail to the ESD shunt device during an ESD event on the second power rail. The present invention advantageously provides ESD protection that can be shared by independent power supply rails with minimal current leakage through the ESD device, thereby reducing the total number of ESD protection circuits on a mixed supply integrated circuit device.

REFERENCES:
patent: 6671153 (2003-12-01), Ker et al.
patent: 7245468 (2007-07-01), Griesbach et al.
patent: 2002/0085328 (2002-07-01), Liu et al.

Affiliated with

Also associated with

Rating

Circuits, architectures, apparatuses, systems, and methods... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Circuits, architectures, apparatuses, systems, and methods..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Circuits, architectures, apparatuses, systems, and methods... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4242871