Circuits and methods for current measurements referred to a...

Details Circuits and methods for current measurements referred to a... Circuits and methods for current measurements referred to a...

2007-07-17

2007-07-17

Tsai, Carol S. W. (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S057000, C702S069000, C702S081000, C702S189000, C323S312000

Reexamination Certificate

active

11489378

ABSTRACT:
Circuitry and methods for obtaining accurate measurements of current supplied by an integrated circuit are provided. Current calculations are performed using information from a precision termination resistor and from the ratio relationship of two on-chip resistors. The invention provides a way to obtain accurate current measurements without the use of component trimming.

REFERENCES:
patent: 5371457 (1994-12-01), Lipp
patent: 5744962 (1998-04-01), Alber et al.
patent: 6400163 (2002-06-01), Melcher et al.
patent: 6472910 (2002-10-01), Niimi
patent: 6909275 (2005-06-01), Hartzsch
patent: 7046494 (2006-05-01), Ball

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