Circuits and methods for characterizing the speed...

Details Circuits and methods for characterizing the speed... Circuits and methods for characterizing the speed...

2005-02-01

2005-02-01

Lee, Benny (Department: 2817)

Oscillators

Ring oscillators

C331SDIG003

Reexamination Certificate

active

06850123

ABSTRACT:
A test oscillator circuit separately measures the signal propagation delay for both rising and falling edges through one or more multi-input combinatorial logic circuits. A number of components are configured in a loop so that they together form a free-running ring oscillator. Each synchronous component passes signal edges to a subsequent component in the ring, so the oscillator produces an oscillating test signal in which the period relates to the delays through the components. In some embodiments, the multi-input combinatorial logic circuits emulate tri-state buffers. These embodiments characterize the speed at which these logic circuits enable and disable signal paths.

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