Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2011-03-08
2011-03-08
Schechter, Andrew (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S064000, C702S065000, C702S072000
Reexamination Certificate
active
07904265
ABSTRACT:
A controllable delay element is coupled in parallel with a calibration circuit. The calibration circuit receives a periodic reference signal and generates a series of sample voltages responsive to a time-varying analog voltage, the periodic reference signal, and the delayed periodic signal at the output of the controllable delay element. The calibration circuit distributes the series of sampled voltages for determining the components of a first vector. The first vector components are used to calculate the phase that results from a control signal applied to the controllable delay element. After the control signal is modified, a second vector is used to calculate the phase that results from the control signal. The delay can be determined by the product of the period of the reference signal and the difference in phase.
REFERENCES:
patent: 7062733 (2006-06-01), Poskatcheev et al.
patent: 7210074 (2007-04-01), Mc Auliffe
Avago Technologies Fiber (IP) Singapore Pte. Ltd.
Huynh Phuong
Schechter Andrew
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