Circuitry for reducing leakage currents in a transmission...

Details Circuitry for reducing leakage currents in a transmission... Circuitry for reducing leakage currents in a transmission...

2005-07-12

2005-07-12

Deb, Anjan (Department: 2858)

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

Frequency of cyclic current or voltage

C327S148000, C327S157000

Reexamination Certificate

active

06917192

ABSTRACT:
A test circuit for connecting a high-impedance node to an external test point when a test signal is enabled. The test circuit comprises: a first transmission gate switch for coupling the high impedance node to a first internal node of the test circuit when the test signal is enabled, the first transmission gate switch comprising a first N-channel transistor having a drain coupled to the high impedance node, a gate coupled to a Logic 1 when the test signal is enabled, and a source coupled to the first internal node. The test circuit also comprises a second transmission gate switch capable of coupling the first internal node to the external test point when the test signal is enabled and a biasing circuit for generating a negative Vgs bias on the first N-channel transistor when the test signal is disabled to thereby reduce leakage current in the first N-channel transistor.

REFERENCES:
patent: 5583821 (1996-12-01), Rose et al.
patent: 5892377 (1999-04-01), Johnston et al.
patent: 5917365 (1999-06-01), Houston
patent: 6320795 (2001-11-01), Balamurugan et al.
patent: 6605935 (2003-08-01), Nilsson

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