Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-09-05
2006-09-05
Tsai, Carol S. W. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S057000, C702S069000, C702S081000, C702S189000, C323S312000
Reexamination Certificate
active
07103487
ABSTRACT:
Circuitry and methods for obtaining accurate measurements of current supplied by an integrated circuit are provided. Current calculations are performed using information from a precision termination resistor and from the ratio relationship of two on-chip resistors. The invention provides a way to obtain accurate current measurements without the use of component trimming.
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Fish & Neave IP Group of Ropes & Gray LLP
Linear Technology Corporation
Morris Robert W.
Mullen Jeffrey D.
Tsai Carol S. W.
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