Circuit testing with ring-connected test instruments modules

Details Circuit testing with ring-connected test instruments modules Circuit testing with ring-connected test instruments modules

2006-05-09

2006-05-09

Hoff, Marc S. (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S118000, C702S121000, C702S125000

Reexamination Certificate

active

07043390

ABSTRACT:
Method and apparatus for circuit testing with ring-connected test instrument modules. A system for controlling one or more test instruments to test one or more integrated circuits includes a master clock and a controller. The test instruments are connected to form a communication ring. The master clock is connected to each test instrument and provides a clock signal to the one or more test instruments. The controller is connected to the communication ring and is configured to align counters of test instruments to derive a common clock time value from the clock signal. The controller is further configured to generate and send data words into the communication ring to carry the data words to each test instrument. The data words includes at least one data word specifying a test event to be performed, a common clock time value, and at least one of the test instruments.

REFERENCES:
patent: 4493079 (1985-01-01), Hughes, Jr.
patent: 5212443 (1993-05-01), West et al.
patent: 5237659 (1993-08-01), Takats
patent: 5461310 (1995-10-01), Cheung et al.
patent: 5477139 (1995-12-01), West et al.
patent: 5646521 (1997-07-01), Rosenthal et al.
patent: 5717704 (1998-02-01), Rosenfeld
patent: 5748642 (1998-05-01), Lesmeister
patent: 5854797 (1998-12-01), Schwartz et al.
patent: 6002868 (1999-12-01), Jenkins et al.
patent: 6115763 (2000-09-01), Douskey et al.
patent: 6285962 (2001-09-01), Hunter
patent: 6331770 (2001-12-01), Sugamori
patent: 6516053 (2003-02-01), Ryan et al.
patent: 6591385 (2003-07-01), Krech, Jr. et al.
patent: 6625557 (2003-09-01), Perkins et al.
patent: 6640322 (2003-10-01), Schultz
patent: 6724729 (2004-04-01), Sikdar

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