Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent
1986-03-10
1988-03-22
Eisenzopf, Reinhard J.
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
324 713, 324 73R, 2504922, G01R 3102
Patent
active
047331747
ABSTRACT:
A testing method and apparatus employs electron beam writing and reading of conductive paths in a circuit device rather than physical probing of conductive elements. Portions of the circuit device, e.g., conductive paths, are bistably stored at a given potential and then the device is read by a reading beam to determine if proper connections exist. Read out is at comparatively high levels represented by the difference between bistable voltage values. Once a portion of the device has been tested, it may remain in stored condition such that additional cross checking or repetition of testing is rendered unnecessary.
REFERENCES:
patent: Re28773 (1976-04-01), Gibson, Jr.
patent: 3882471 (1975-05-01), Walker et al.
patent: 4139800 (1979-02-01), Ostermeier et al.
patent: 4232250 (1980-11-01), Richards
patent: 4417203 (1983-11-01), Pfeiffer et al.
patent: 4490643 (1984-12-01), Silver
patent: 4573008 (1986-02-01), Lischke
"Tri-Potential Method for Testing Electrical Opens and Shorts in Multi-Layer Ceramic Packaging Modules", by Chang et al, IBM Tech. Disc. Bull., vol. 24, #11A, pp. 5388-5390, 4/82.
"Improvement of Voltage Contrast in the Scanning Electron Probe by Floating the Ground Potential of the Device", by Furakawa et al. J. Voc. Sci Technol. 12/78, pp. 1853-1855.
Burns W.
Dellett John P.
Eisenzopf Reinhard J.
Hulse Robert S.
Textronix, Inc.
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