Circuit testing method and apparatus

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor

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324 713, 324 73R, 2504922, G01R 3102

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active

047331747

ABSTRACT:
A testing method and apparatus employs electron beam writing and reading of conductive paths in a circuit device rather than physical probing of conductive elements. Portions of the circuit device, e.g., conductive paths, are bistably stored at a given potential and then the device is read by a reading beam to determine if proper connections exist. Read out is at comparatively high levels represented by the difference between bistable voltage values. Once a portion of the device has been tested, it may remain in stored condition such that additional cross checking or repetition of testing is rendered unnecessary.

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patent: 4490643 (1984-12-01), Silver
patent: 4573008 (1986-02-01), Lischke
"Tri-Potential Method for Testing Electrical Opens and Shorts in Multi-Layer Ceramic Packaging Modules", by Chang et al, IBM Tech. Disc. Bull., vol. 24, #11A, pp. 5388-5390, 4/82.
"Improvement of Voltage Contrast in the Scanning Electron Probe by Floating the Ground Potential of the Device", by Furakawa et al. J. Voc. Sci Technol. 12/78, pp. 1853-1855.

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