Circuit testing apparatus

Details Circuit testing apparatus Circuit testing apparatus

2011-03-15

2011-03-15

Tsai, Carol S (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S085000, C702S107000, C702S120000, C702S121000, C714S718000, C714S724000, C714S725000, C714S735000, C714S742000, C714S738000, C324S074000, C324S073100, C324S537000, C324S762030, C324S750010, C324S762020, C324S756010, C324S765010, C716S106000, C716S136000

Reexamination Certificate

active

07908108

ABSTRACT:
A circuit testing apparatus for testing a device under test is disclosed. The device under test comprises a first output end and second output end for generating a first output signal and a second output signal, respectively. The circuit testing apparatus determines a test result for the device under test according to the first output signal and the second output signal.

REFERENCES:
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patent: 6380730 (2002-04-01), Arkin et al.
patent: 6801869 (2004-10-01), McCord
patent: 2009/0113260 (2009-04-01), Teng et al.
patent: 2009/0121726 (2009-05-01), Hashimoto
patent: 2010/0079159 (2010-04-01), Kemmerling

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