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Electricity: measuring and testing – Plural – automatically sequential tests

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Details

324158R, 324 73AT, 371 20, 371 25, G01R 1512

Patent

active

048272086

ABSTRACT:
In circuit testers, notably automatic test equipment for the in circuit testing of digital devices, overheating damage can result if outputs are repeatedly "overdriven", that is, while applying a test input to a first device, an output of a second connected device is forced into a state contrary to that it would normally adopt. Damage is avoided by enforcing a cooling interval between overdriving tests based upon a list of parameters representative of the overdriven device and its environment. In order to reduce the overall test time, a parameter is based on a measurement derived from a circuit of the type under test. A first test results in device heating to a value. A cooling interval is enforced so that a subsequent test which results in further heating of the device, may be made without exceeding device maximum allowable temperature .sup.T max.

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patent: 4556840 (1985-12-01), Russell
patent: 4588945 (1986-05-01), Grooves et al.
Kett; "A Software Programmable Digital System at Low Cost"; Metropole Convention Centre, Brighton, New Developments in Automatic Testing; Nov. 30-Dec. 2, 1977.

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