Circuit tester having on-the-fly comparison of actual and expect

Details Circuit tester having on-the-fly comparison of actual and expect Circuit tester having on-the-fly comparison of actual and expect

1984-01-03

1987-02-10

Karlsen, Ernest F.

Electricity: measuring and testing

Plural, automatically sequential tests

371 25, G01R 3128

Patent

active

046425616

ABSTRACT:
A circuit tester and test technique are presented that compresses the amount of data stored in local test data RAMs for the implementation of a circuit test, thereby reducing the amount of data that must be downloaded to the local test data RAMs, thereby improving test throughput. Derivative data vectors are utilized in addition to raw data vectors as part of the data compression technique. Further compression results from storing only unique data vectors in the local test data RAMs and utilizing a sequencer to control the order in which the unique data vectors are utilized. The sequencer includes test program logic and logic capable of implementing on test pins indirect counters.

REFERENCES:
patent: 3302109 (1967-12-01), Jones
patent: 4271515 (1981-06-01), Axtell, III et al.
Faran, Jr., J. J.; "Methods of Assignment . . . "; 1982 IEEE Test Conference; May 1982; pp. 641-647.

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