Circuit test device

Details Circuit test device Circuit test device

1995-02-24

1997-03-04

Wieder, Kenneth A.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

3241581, 324765, G01R 3100, G01R 3126

Patent

active

056083297

ABSTRACT:
A circuit test device for carrying out a DC Test and a Function Test on a test object without using a relay, wherein a first differential circuit receives a signal from a test object; a current source supplies a current to the test object; a second differential circuit receives an output from the first differential circuit and supplies a current to the test object; a current measuring circuit measures the current flowing through the second differential circuit; and a control circuit controls the current source and the current in the second differential circuit while applying a voltage to the first differential circuit and provides a set voltage to the first differential circuit for the test object when carrying out the DC Test, and provides a set current in the second differential circuit when carrying out the Function Test.

REFERENCES:
patent: 4408128 (1983-10-01), Fujita
patent: 4706015 (1987-11-01), Chen
patent: 4733173 (1988-03-01), Bach et al.
patent: 4998026 (1991-03-01), King
patent: 5552712 (1996-09-01), Weir et al.

Affiliated with

Also associated with

Rating

Circuit test device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Circuit test device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Circuit test device will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2148610