Circuit system for adjusting the input of a connected-up logic c

Electricity: measuring and testing – Plural – automatically sequential tests

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Details

235153AC, 324 73AT, 307215, G01R 1512

Patent

active

040413845

ABSTRACT:
A test circuit for stimulating the inputs of preprogrammed logic circuits, having a pulse input terminal connected to one of the inputs of a NAND circuit. The output of the NAND circuit is connected via a first resistor to the base of a first switching PNP transistor, the emitter of which is connected to a first positive voltage supply terminal and the collector of which is connected to the collector of a second switching NPN transistor. The base of the second NPN transistor is connected both through a fourth resistor to an earth terminal of the circuit system and through a third resistor and a second resistor to a second positive voltage supply terminal and the emitter of which is connected both through a fifth resistor to the earth terminal of the circuit system and to an output terminal. The output terminal is connected to a measuring point or probe which is connected to the input of the connected-up logic circuit. The connected-up logic circuit is connected to the earth terminal of the test circuit system.

REFERENCES:
patent: 3657527 (1972-04-01), Kassabgi et al.
patent: 3673397 (1972-06-01), Schaefer

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