Semiconductor device manufacturing: process – Making passive device – Trench capacitor
Patent
1995-11-13
1998-06-02
Bowers, Jr., Charles L.
Semiconductor device manufacturing: process
Making passive device
Trench capacitor
438243, H01L 2120
Patent
active
057599033
ABSTRACT:
A circuit structure having at least one capacitor and a method for the manufacture thereof. The capacitor is constructed of a doped, single-crystal silicon substrate (1) that is provided with a plurality of hole openings (3) by electrochemical etching in a fluoride-containing, acidic electrolyte wherein the substrate is connected as an anode. The capacitor is further constructed of a dielectric layer (4) and of a conductive layer (5) as a cooperating electrode.
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Morie et al, "Depletion Trench Capacitor Technology for Megabit Level MOS dRAM.", IEEE Electron. Device LeHors, vol. EDL-4, No. 11 Nov. 19 83 pp. 411-413.
Boy Michael
Hoenlein Wolfgang
Lehmann Volker
Bowers Jr. Charles L.
Siemens Aktiengesellschaft
Thomas Toniae M.
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