Circuit property measurement method

Details Circuit property measurement method Circuit property measurement method

2007-02-06

2007-02-06

Hollington, Jermele (Department: 2829)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Calibration

C324S754090, C324S095000, C324S1540PB

Reexamination Certificate

active

11055698

ABSTRACT:
In a high frequency circuit property measurement method, prior to property measurements of a high frequency circuit with RF measurement probe heads, RF measurement probe heads are calibrated using a calibration pattern comprising a signal line having a characteristic impedance and extending on a dielectric substrate, a first GND pad having one end disposed close to and at an interval from a first end of the signal line, a second GND pad having one end disposed close to and at an interval from a second end of the signal line, and a conductor electrically coupling the first GND pad to the second GND pad.

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Carlton, D.E. et al.; “Microwave Wafer Probing Achieves On-Wafer Measurements Through 18 GHz”, Reprinted from the May 1985 edition ofMSN&Communications Technology.

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