Circuit probe for measuring a differential circuit

Details Circuit probe for measuring a differential circuit Circuit probe for measuring a differential circuit

1994-07-05

1996-10-01

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

333246, G01R 106, H01P 308

Patent

active

055613780

ABSTRACT:
A circuit probe (300) is provided for measuring a differential circuit. The circuit probe (300) incorporates a novel transmission line (325) which is formed to propagate signals with substantially equal even-mode and odd-mode characteristic impedances. The circuit probe (300) further includes signal contacts (314, 316) and ground contacts (312, 318) coupled to signal conductors (334, 336) and ground conductors (332, 338), respectively, of the transmission line (325).

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Microwave Wafer Probing, by Dale E. Carlton, K. Reed Gleason and Eric Strid, Microwave Journal, Jan. 1984, pp. 121-129.
Shielded Coupled-Strip Transmission Line, by S. E. Cohn, IRE Transactions--Microwave Theory and Techniques, Oct., 1955, pp. 29-38.

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