Circuit pattern inspection device, circuit pattern...

Details Circuit pattern inspection device, circuit pattern... Circuit pattern inspection device, circuit pattern...

2005-09-13

2005-09-13

Patel, Paresh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S686000, C324S690000

Reexamination Certificate

active

06943559

ABSTRACT:
Disclosed is an circuit-pattern inspection apparatus comprising a power supply element30adapted to be capacitively coupled with a parallel array of conductive patterns20to supply an inspection signal to one end of each of the conductible patterns, an open sensor40adapted to be capacitively coupled with all of the other ends of the conductive patterns to detect the inspection signal, and a short sensor50arranged at a position displaced from the power supply element30and adapted to be capacitively coupled with two lines of the conductive patterns to detect the inspection signal. The quality of the conductive pattern is inspected such that the presence of disconnection is determined when the detect signal from the open sensor40is largely reduced, and the presence of short is determined when the detect signal from the short sensor50largely rises and then falls. The circuit-pattern inspection apparatus can detect defects in a circuit board reliably and readily.

REFERENCES:
patent: 3975680 (1976-08-01), Webb
patent: 4565966 (1986-01-01), Burr et al.
patent: 4733235 (1988-03-01), Baer et al.
patent: 5006808 (1991-04-01), Watts
patent: 5256975 (1993-10-01), Mellitz et al.
patent: 63-226688 (1988-09-01), None
patent: 05-333357 (1993-12-01), None

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