Circuit means for collecting operational errors in IC chips and

Details Circuit means for collecting operational errors in IC chips and Circuit means for collecting operational errors in IC chips and

1977-09-30

1979-02-13

Tokar, M.

Electricity: measuring and testing

Plural, automatically sequential tests

324 51, 324 73AT, 324 73PC, G01R 1512

Patent

active

041398181

ABSTRACT:
The present disclosure describes electronic circuits for use with test and diagnostic (T&D) means to collect errors orignating within integrated circuit (IC) chips during their operation in a system environment. Moreover, the circuits employ counters and a memory to identify and store the location of the defective chips so that prompt remedial action may be taken.

REFERENCES:
patent: 3763430 (1973-10-01), Terrey
patent: 3777261 (1973-12-01), Strenglein
patent: 3831149 (1974-08-01), Job

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