Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-04-24
2007-04-24
Nghiem, Michael (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C324S701000
Reexamination Certificate
active
11120942
ABSTRACT:
A circuit inspection method includes supplying electric charges to a first, second, and third electric charge holding electrodes in an electric circuit; outputting the electric charges held in the first electric charge holding electrode after a predetermined period of time from supplying of the electric charges; changing voltages of the first and second scan lines to a drive voltage to output the electric charges held in the second electric charge holding electrode; and determining whether an electric charge writing function and an electric charge holding function of the second electric charge holding electrode are good or not based on a quantity of the supplied electric charges and a quantity of the electric charges output from the second electric charge holding electrode.
REFERENCES:
patent: 6930505 (2005-08-01), Taguchi et al.
patent: 2002-074999 (2002-03-01), None
patent: 2002-196357 (2002-07-01), None
patent: 2003-330034 (2003-11-01), None
Kodate Manabu
Taguchi Tomoyuki
CMO Japan Co., Ltd.
Nghiem Michael
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