Circuit for testing microprocessor memories

Details Circuit for testing microprocessor memories Circuit for testing microprocessor memories

1996-03-11

1997-04-15

Beausoliel, Jr., Robert W.

Excavating

39518318, 371 212, 371 27, 3642653, G06F 1100, G11C 2900

Patent

active

056218834

ABSTRACT:
A Direct Memory Access (DMA) controller incorporates a memory test circuit that executes, using a dedicated system, repetitive memory read and write test phases such as are executed in conventional memory test methods by programs.

REFERENCES:
patent: 4715034 (1987-12-01), Jacobson
patent: 4873705 (1989-10-01), Johnson
patent: 5109382 (1992-04-01), Fukunaka
patent: 5157664 (1992-10-01), Waite
patent: 5423029 (1995-06-01), Schieve
R. Nair et al., Efficient Algorithms for Testing Semiconductor Random-Access Memories, IEEE Transactions on Computer, vol. C-27, No. 6, Jun. 1978, pp. 572-576.

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