Circuit for testing internal voltage of semiconductor memory...

Details Circuit for testing internal voltage of semiconductor memory... Circuit for testing internal voltage of semiconductor memory...

2011-02-28

2011-12-27

Phan, Huy Q (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S762010, C714S718000

Reexamination Certificate

active

08085056

ABSTRACT:
An internal voltage test circuit of a semiconductor memory apparatus includes a comparing unit for comparing a level of internal voltage with a level of external voltage to output a comparison result as an output signal during a test mode, and an output selecting unit for outputting the output signal to a data output pad during the test mode, and outputting a data signal to the data output pad during a normal operation mode.

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