Circuit for testing internal data bus of integrated circuit

Details Circuit for testing internal data bus of integrated circuit Circuit for testing internal data bus of integrated circuit

1990-12-10

1992-08-11

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324537, 371 295, G01R 3128, G06F 1100

Patent

active

051382571

ABSTRACT:
An internal bus test circuit for testing an integrated circuit internal bus which interconnects a plurality of function modules of the integrated circuit, the test circuit including switches that are operable for isolating respective modules from the bus, a bus setting circuit enabling individual lines to the bus to be set to a desired logic level, and a by-pass bus with corresponding by-pass circuits, for a function module that is connected between the bus and external pads. The test circuit thereby enables the bus functions to be easily tested in real-time operation, independently of the respective conditions of the test modules that are connected to the bus.

REFERENCES:
patent: 4514845 (1985-04-01), Starr
patent: 4622669 (1986-11-01), Pri-Tal
patent: 4951283 (1990-08-01), Mastrocola et al.

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