Circuit for testing high frequency current amplifying capability

Details Circuit for testing high frequency current amplifying capability Circuit for testing high frequency current amplifying capability

1977-04-29

1979-01-16

Rolinec, Rudolph V.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

G01R 3122

Patent

active

041351533

ABSTRACT:
A transistor test circuit provides for the selection of preferably three widely differing test frequencies for testing transistors normally having respectively relatively small, intermediate and large frequency gain-bandwidth product characteristics. These test frequencies are each much greater than the assumed normal cut-off frequency of the transistors to be tested thereby, and preferably only a fraction of the frequency at which the current gain of normal transistors would decrease to one. The test circuit is designed to form a linear amplifier circuit with the transistor under test and is provided with an automatic base drive control circuit which provides a substantially fixed predetermined DC collector current, despite wide variations in the current gain between different transistors being tested. The circuit further includes an indicating means for displaying the product of the selected test frequency and the current gain of the transistor under test, as indicated by the amplitude of the amplified test frequency signal in the collector circuit of the transistor under test.

REFERENCES:
patent: 3350641 (1967-10-01), Lubkin et al.
patent: 3622883 (1971-11-01), Haire

Affiliated with

Also associated with

Rating

Circuit for testing high frequency current amplifying capability does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Circuit for testing high frequency current amplifying capability, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Circuit for testing high frequency current amplifying capability will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-653737