Circuit for programming antifuse bits

Static information storage and retrieval – Read only systems – Fusible

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3652257, G11C 1700

Patent

active

060551739

ABSTRACT:
A method of verifying whether unprogrammed antifuses are leaky in a semiconductor memory. The method involves the steps of: connecting the antifuse in series with a node; providing current to the node, the current being sufficient to charge the node from a first to a second voltage; detecting whether the voltage at the node charges to the second voltage, or remains at the first voltage to indicate that the antifuse is leaky; outputting signals indicating the result of the detection; and detecting the voltage at the node remains at the first voltage indicates that the antifuse is leaky. In another embodiment, a method of verfying whether antifuses have been programmed properly in a semiconductor memory. The method includes the steps of: connecting the antifuse in series with a node; providing current to the node through a parallel combination of a first transistor and a second transistor that is sufficient to charge the node from a first voltage to a second voltage; and detecting whether the voltage at the node charges to the second voltage or remains at the first voltage to indicate that the antifuse is programmed properly; outputting first and second signals indicating the result of the detection; and detecting the voltage at the node remains at the first voltage indicates that the antifuse is programmed properly.

REFERENCES:
patent: 5418487 (1995-05-01), Armstrong
patent: 5619469 (1997-04-01), Joo
patent: 5677882 (1997-10-01), Isa
patent: 5677884 (1997-10-01), Zagar
patent: 5731734 (1998-03-01), Pathak

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