Circuit for multi-pads test

Details Circuit for multi-pads test Circuit for multi-pads test

2011-03-01

2011-03-01

Nguyen, Ha Tran T (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07898279

ABSTRACT:
The present invention relates to a circuit for multi-pads test, which is used for testing a plurality of pads. The circuit comprises one or more testing circuits, a plurality of testing switches, and a plurality of pad switches. The plurality of testing switches is coupled between the testing circuits and the plurality of pads, respectively; the plurality of pad switches is coupled between the pads, respectively. Thereby, by coordination of the plurality of pad switches and the plurality of testing switches, the number of testing probes of the testing apparatus for testing the pads can be reduced, the design difficulty of the testing apparatus can be reduced, and thus the costs can be reduced.

REFERENCES:
patent: 2008/0106957 (2008-05-01), Park
patent: 2008/0265928 (2008-10-01), Tsuchiya

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