Measuring and testing – Gas analysis – Moisture content or vapor pressure
Patent
1975-12-09
1976-09-07
Woodiel, Donald O.
Measuring and testing
Gas analysis
Moisture content or vapor pressure
733624, G01K 702
Patent
active
039787290
ABSTRACT:
This invention relates to an improved circuit for measuring temperature in a region at high electric potential and generating a read-out of the same in a region at lower potential. The circuit is specially designed to combine high sensitivity, stability, and accuracy. A major portion of the circuit situated in the high-potential region can take the form of an integrated circuit. The preferred form of the circuit includes an input section which is situated in the high-potential region and comprises a temperature-compensated thermocouple circuit for sensing temperature, an oscillator circuit for generating a train of ramp voltages whose rise time varies inversely with the thermocouple output, a comparator and switching circuit for converting the oscillator output to pulses whose frequency is proportional to the thermocouple output, and a light-emitting diode which is energized by these pulses. An optical coupling transmits the light pulses generated by the diode to an output section of the circuit, situated in a region at ground. The output section comprises means for converting the transmitted pulses to electrical pulses of corresponding frequency, means for amplifying the electrical pulses, and means for displaying the frequency of the same. The preferred embodiment of the overall circuit is designed so that the frequency of the output signal in hertz and tenths of hertz is equal to the sensed temperature in degrees and tenths of degrees.
REFERENCES:
patent: 3488586 (1970-01-01), Watrous et al.
patent: 3940987 (1976-03-01), Green et al.
Carlson Dean E.
Lewis Fred O.
The United States of America as represented by the United States
Woodiel Donald O.
Zachry David S.
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