Circuit for measuring the internal resistance of a lambda probe

Details Circuit for measuring the internal resistance of a lambda probe Circuit for measuring the internal resistance of a lambda probe

1990-10-04

1992-02-25

Wieder, Kenneth A.

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

324713, 324721, 20415316, 204424, 123440, G01R 2702

Patent

active

050916980

ABSTRACT:
A circuit for measuring the internal resistance of a lambda probe 10 is provided with a junction device 16 for selectively loading the probe. Loading the probe via a junction device affords the advantage that an internal-resistance measurement can be effected in a simple manner within a very wide range of from several ohms up to several megaohms.

REFERENCES:
patent: 4419190 (1983-12-01), Dietz et al.
patent: 4586476 (1986-05-01), Asayama et al.
patent: 4742808 (1988-05-01), Blumel et al.
patent: 4759328 (1988-07-01), Blumel et al.

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