Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1995-10-24
1998-02-24
Nguyen, Vinh P.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
3241581, G01R 3100
Patent
active
057214956
ABSTRACT:
A quiescent test circuit for interfacing a high precision integrated circuit tester to a device under test (DUT). The quiescent test circuit is capable of supplying a high powered (V1) voltage supply to a DUT while the DUT's desired dynamics internal state is reached. At this point, the integrated circuit tester, sends an active select signal to the quiescent test circuit instantaneously which deselects the high-powered (V1) voltage supply to the DUT and selects the integrated circuit tester's parametric measurement unit low power (V4) voltage supply for powering the DUT. The integrated circuit tester, through its parametric measurement unit is capable of precisely measuring the very low quiescent current of the DUT, while powering the DUT.
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Fell III Joseph H.
Jennion Mark W.
Scorsone Joseph J.
Selby III Paul H.
Nguyen Vinh P.
O'Rourke John F.
Sowell John B.
Starr Mark T.
Unisys Corporation
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