Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1997-05-13
1998-09-08
Do, Diep N.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324715, 324126, G01R 2708
Patent
active
058049797
ABSTRACT:
A circuit for measuring alternating current (a.c.) and direct current (d.c.) in a conductor without breaking the conductor is provided. A modulated current source is coupled in parallel with a segment of the conductor to inject a test current. A synchronous demodulator is also coupled in parallel across the segment to separate the test voltage drop induced by the test current from the voltage drop due to the current in the conductor. The test voltage drop and the voltage drop are measured by a voltmeter and the resistance of the segment and the current flowing through the segment can then be calculated.
REFERENCES:
patent: 3863148 (1975-01-01), Fellrath et al.
patent: 4175253 (1979-11-01), Pitegoff
patent: 4584525 (1986-04-01), Harnden, Jr. et al.
patent: 5386188 (1995-01-01), Minneman et al.
Lund John M.
Swift Steven Dennis
Do Diep N.
Fluke Corporation
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