Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate
2007-05-21
2010-02-09
Nguyen, Viet Q (Department: 2827)
Static information storage and retrieval
Floating gate
Particular biasing
C365S196000, C365S189150, C365S205000, C365S189080
Reexamination Certificate
active
07660162
ABSTRACT:
A circuit measures current passing through a memory cell in a NAND flash memory. The circuit includes a decoder and an analog mixer. The decoder is configured to select at least one data line coupled to page buffers and column decoders in accordance with a controlling signal. The analog mixer is configured to output current passing through the selected data line, or to couple all of the data lines to a means for measuring current in accordance with a total current measurement controlling signal.
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Hynix / Semiconductor Inc.
Nguyen Viet Q
Townsend and Townsend / and Crew LLP
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