Circuit for measuring capacitance at high DC bias voltage

Details Circuit for measuring capacitance at high DC bias voltage Circuit for measuring capacitance at high DC bias voltage

1992-09-21

1994-06-14

Wieder, Kenneth A.

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

324678, G01R 2726

Patent

active

053213670

ABSTRACT:
A circuit for measuring capacitor properties under high DC bias voltage. A apacitor is subject to a high DC bias by a high voltage supply having low AC impedance. A triangle wave voltage is applied to the capacitor at the terminal opposite the high bias voltage. A current is thereby induced due to the voltage difference across the capacitor generated by the triangle wave. The induced current is measured and properties of the capacitor calculated therefrom. The measuring circuitry is isolated from the high DC bias voltage applied to the capacitor. Therefore, the biasing voltage applied to the capacitor is limited only by the breakdown voltage of the capacitor under test.

REFERENCES:
patent: 4050018 (1977-09-01), Goodman
patent: 4149231 (1979-04-01), Bukosky et al.
patent: 4165483 (1979-08-01), Holdren et al.
patent: 4404517 (1983-09-01), Machida
patent: 4806846 (1989-02-01), Kerber
patent: 5014011 (1991-05-01), Colvin

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