Circuit for improved diagnosability of defects in a fuse...

Details Circuit for improved diagnosability of defects in a fuse... Circuit for improved diagnosability of defects in a fuse...

2006-07-04

2006-07-04

Deb, Anjan (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S537000, C714S718000

Reexamination Certificate

active

07071704

ABSTRACT:
An apparatus comprising a first control circuit, a second control circuit, a latch circuit and a flip-flop. The first control circuit may be configured to generate a first control signal in response to (i) an input signal from a fuse and (ii) one or more read signals. The latch circuit may be configured to change status in response to the first control signal. The second control circuit may be configured to change the state of the latch circuit in response to (i) one or more read signals and (ii) one or more set signals. The flip-flop may be configured to capture the state of the fuse in response to changing the state of the latch circuit with the first control circuit or the second control circuit.

REFERENCES:
patent: 6886117 (2005-04-01), Ku
patent: 2003/0226078 (2003-12-01), Meaney et al.
Rabaey et al., Digital Integrated Circuits, 2003, Prentice Hall, Second Edition, pp. 358-361.

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