Electricity: measuring and testing – Testing potential in specific environment – Voltage probe
Patent
1984-05-10
1987-02-24
Levy, Stewart J.
Electricity: measuring and testing
Testing potential in specific environment
Voltage probe
324 73PC, 307296R, 330156, 330292, G01R 3102
Patent
active
046460020
ABSTRACT:
A zero capacitance measurement probe to be used to make electrical measurements at a broad range of frequencies without having the probe itself affect the measured values. The probe reduces internal capacitances in the solid state active elements or creates a negative impedance to counteract capacitance external capacitance. Elimination of capacitance is accomplished by adjusting gains and current flow within active elements and by insulating the elements from ground by an additional substrate and metalized layer.
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G.G.B. Industries, Dec. 22, 1981, advertisement.
IEEE Journal of Solid-State Circuits, vol. SC-15, No. 2, pp. 177-183, Apr. 1980, "Function Testing of Bipolar IC's and LSI's with the Stroboscopic Scanning Electron Microscope".
IEEE Journal of Solid-State Circuits, vol. SC-9, No. 6, pp. 332-340 Dec. 1974, "A Fast-Settling Monolithic Operational Amplifier Using Doublet Compression Techniques".
IEEE Journal of Solid-State Circuits, vol. SC-12, No. 3, pp. 217-224, Jun. 1977, "A Low Input Capacitance Voltage Follower In a Compatible Silicon-Gate MOS-Bipolar Technology".
Levy Stewart J.
O'Shea Kevin D.
Regents of the University of Minnesota
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