Oscillators – With frequency calibration or testing
Patent
1995-06-07
1997-06-10
Grimm, Siegfried H.
Oscillators
With frequency calibration or testing
324763, 331111, 331143, H03L 700, H03B 524
Patent
active
056380291
ABSTRACT:
A clock overdrive function is provided which advantageously facilitates testing of circuits incorporating timing circuits. The clock overdrive function allows a tester to furnish a clock pulse timing reference to drive a circuit containing a system clock, thereby overdriving the system clock signal. Overdriving of the system clock signal allows precise control of circuit timing. A method of overdriving a system clock signal includes the steps of forming a low reference voltage and a high reference voltage, applying a timing signal having a timing signal voltage at an external pin, comparing the timing signal voltage at the external pin to the low reference voltage and the high reference voltage, driving the circuit with the system clock timing signal when the timing signal voltage at the external pin is less than the low reference voltage and driving the circuit with the timing signal at the external pin, otherwise.
REFERENCES:
patent: 4998075 (1991-03-01), Patton, III et al.
patent: 5017919 (1991-05-01), Hull et al.
patent: 5045782 (1991-09-01), Koyama
S.M. Sze, "Physics of Semiconductor Devices", .COPYRGT.1969, FIG. 20. John Wiley & Sons, New York.
American Microsystems
Grimm Siegfried H.
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