Circuit for determining window margin for data transitions in a

Details Circuit for determining window margin for data transitions in a Circuit for determining window margin for data transitions in a

1992-10-01

1995-03-28

Hajec, Donal33021

Dynamic magnetic information storage or retrieval

General processing of a digital signal

Data clocking

G11B 509

Patent

active

054022738

ABSTRACT:
This invention is directed to a method and a circuit for determining a relative phase shift between a data transition and a data separator window which are used to decode data read back from a mass storage device. The data separator windows provide a time interval in which a data transition must occur in order to be properly interpreted. This is accomplished by delaying the occurrence of the data transition, thereby shifting it toward the trailing edge of the data separator window, to determine if the delayed data transition occurs late within the data separator window. At the same time, the occurrence of the data separator window is delayed, thereby shifting the leading edge of the data separator window toward the data transition, to determine if the data transition occurs late within the data separator window. By delaying the data separator window and the data transition by known, predetermined amounts, a phase shift between the data transition and a particular data separator window in which it occurs can be determined. It is also an object of this invention that if the data transition does not occur within the delayed data separator window or the delayed data transition does not occur within the data separator window, the data transition will be dropped from the data stream and a data read error will have occurred.

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Mackintosh, Nigel D. A Margin Analyser for Disk and Tape Drives, IEEE Transactions on Magnetics, vol. MAG-17, No. 6, Nov. 1981.
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MackinTosh, Nigel D. Evaluation of Disk Drives by Margin Analysis, Century Data Systems, International Peripherals and Software Exposition, Oct. 1, 1982.
Lerma, Jesse, Correlation of Bit Shift, Margin and Error Rate, Applied Data Communications, ANSI X357.1.1 Aug. 5, 1986.
Baldwin, Dale, Disk Drive Analyzer Speeds Testing with Innovative Graphics, Electronic Design, May 16, 1985.
Juliff, Michael F., Testing Winchester Disk Drives, Mini/Micro Systems, Feb. 1983.

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