Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – For fault location
Reexamination Certificate
2011-01-11
2011-01-11
Valone, Thomas (Department: 2831)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
For fault location
C324S713000, C702S058000, C702S064000
Reexamination Certificate
active
07868622
ABSTRACT:
Provided is a circuit for detecting power supply voltage drop having a small circuit scale. An NMOS transistor (12) generates a source voltage based on a voltage obtained by subtracting an absolute value of a threshold voltage and an overdrive voltage from a power supply voltage with reference to the power supply voltage. An NMOS transistor (17) is turned on/off based on the source voltage of the NMOS transistor (12). A PMOS transistor (15) generates a source voltage based on a voltage obtained by adding an absolute value of a threshold voltage and an overdrive voltage to a ground voltage with reference to the ground voltage. A PMOS transistor (19) is turned on/off based on the source voltage of the PMOS transistor (15).
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patent: 7161861 (2007-01-01), Gogl et al.
patent: 2006/0261860 (2006-11-01), Yamada
patent: 2008/0191787 (2008-08-01), Nedovic
patent: 2005-278056 (2005-10-01), None
Tomoya et al., JP 2005-278056, JPO Machine Translation, English version, Aug. 31, 2010.
Brinks Hofer Gilson & Lione
Seiko Instruments Inc.
Valone Thomas
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