Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2006-10-10
2006-10-10
Deb, Anjan (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S679000
Reexamination Certificate
active
07119555
ABSTRACT:
A circuit for detecting a difference in capacitance between a first capacitor and a second capacitor provided in a sensor includes an oscillator configured to generate an oscillating signal, a phase comparator coupled to the oscillator to output a signal responsive to a phase difference between the oscillating signal delayed by the first capacitor and the oscillating signal delayed by the second capacitor, an integration circuit coupled to the phase comparator to output an integrated signal made by integrating the signal responsive to the phase difference over a time period equal to a predetermined number of cycles of the oscillating signal, and a sample-and-hold circuit coupled to the integration circuit to output a signal made by sampling and holding the integrated signal at substantially an end of the time period.
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patent: 5659254 (1997-08-01), Matsumoto et al.
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patent: 6304091 (2001-10-01), Shahoian et al.
patent: 2005/0253596 (2005-11-01), Kitano et al.
patent: 07029694 (1995-01-01), None
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patent: 10-227644 (1998-08-01), None
Doi Takehito
Takekawa Koji
Arent & Fox PLLC
Deb Anjan
Fujitsu Limited
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