Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-02-21
2006-02-21
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C710S030000, C370S506000
Reexamination Certificate
active
07003407
ABSTRACT:
The invention concerns non-contact smart cards and, more particularly in such cards, a circuit for detecting data frames and providing them with a parallel format for their processing. The invention is characterised in that it consists in using the information contained in the first octets of the frame being currently received, thereby enabling to identify them as they are received and route them into registers (80). This is provided by a state machine (60) whereof the shift from one state to the other is switched by the circuitry (62, 76) output signals.
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French Preliminary Examination Report dated Jul. 19, 2001 for PCT/FR00/02946.
Kari Ahmed
Moreaux Christophe
Baran Mary Catherine
Fleit Kain Gibbons Gutman Bongini & Bianco P.L.
Gibbons Jon A.
Hoff Marc S.
Jorgenson Lisa K.
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