Circuit for compensating charge leakage in a low pass filter...

Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Synchronizing

Reexamination Certificate

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Details

C327S156000

Reexamination Certificate

active

06980038

ABSTRACT:
The present invention provides for a phased locked loop. A capacitor has an associated leakage current. A differential circuit is coupled to the capacitor of a low pass filter. A voltage follower circuit is coupled to the output of the differential circuit. The gate of a field effect transistor (FET) is coupled to an output of the voltage follower circuit. A current mirror is coupled to the FET, the current mirror having a first source and a second source, wherein the second current mirror source is coupled to the drain of the FET, wherein an output of the first current mirror source is coupled to the capacitor. Through the employment of current mirror source, leakage charge within the capacitor is replaced.

REFERENCES:
patent: 4229699 (1980-10-01), Frissell
patent: 4250411 (1981-02-01), Kriedt
patent: 4970405 (1990-11-01), Hagiwara
patent: 5099141 (1992-03-01), Utsunomiya
patent: 5113862 (1992-05-01), Mortazavi
patent: 5122677 (1992-06-01), Sato
patent: 5155380 (1992-10-01), Hwang et al.
patent: 5231636 (1993-07-01), Rasmussen
patent: 5315181 (1994-05-01), Schowe
patent: 5357146 (1994-10-01), Heimann
patent: 5449999 (1995-09-01), Edwards
patent: 5489888 (1996-02-01), Jagiella et al.
patent: 5729179 (1998-03-01), Sumi
patent: 5754067 (1998-05-01), Komatsu et al.
patent: 5787135 (1998-07-01), Clark
patent: 6157694 (2000-12-01), Larsson
patent: 6265930 (2001-07-01), Walker et al.
patent: 6285263 (2001-09-01), Anderson
patent: 6388506 (2002-05-01), Voo
patent: 6396305 (2002-05-01), Carlson
patent: 6466096 (2002-10-01), DeVito
patent: 6501304 (2002-12-01), Boerstler et al.
patent: 6678132 (2004-01-01), Carruthers et al.
patent: 6696881 (2004-02-01), Ho
patent: 2005/0035797 (2005-02-01), Frans et al.
patent: 2005/0110535 (2005-05-01), Bernstein et al.
Schroder, Deiter K.; “Semiconductor Material and Device Characterization”; John Wiley & Sons, Inc., 1998, p. 391-394.

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